Doubling Memory Tester Capability by efficient expansion of hardware and software WAHL, M. G.; SCHULTZ, H.: Doubling Memory Tester Capability by efficient expansion of hardware and software. European Test Workshop, Maastricht, 2003
Prince - Process Information and Management Center WAGENER, A.; POPP, J.; HAHN, K.: Prince - Process Information and Management Center. In: Proceedings Micro System Technologies 2003, München, 2003. – MST 2003
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data M. G. Wahl, S. Bhawmik, K. Zarrineh, P. Ghosh, S. Davidson, P. Harrod: The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. ITC, Charlotte, 2003
Using DFT Disclosure Information for Economic Merging of Soft Cores M. Wahl, S. Bhawmik: Using DFT Disclosure Information for Economic Merging of Soft Cores. VLSI Test Symposium, Napa Valley, 2003
Eine Entwurfsmethodik für die Mikrosystemtechnik und Post-CMOS WAGENER, A.; HAHN, K.: Eine Entwurfsmethodik für die Mikrosystemtechnik und Post-CMOS. In: Proceedings Austrochip 2003, Linz, 2003. – Austrochip 2003
Considerations for MEMS physical design sta HAHN, K.; WAGENER, A.: Considerations for MEMS physical design stages. Invited Tutorial, Sophia Antipolis Microelectronics, Sophia Antipolis. 2003. – SAME 2003
Process Management and design for MEMS and microelectronic technologies Hahn, Kai; Wagener, Andreas; Popp, Jens; Brück, Rainer: Process Management and design for MEMS and microelectronic technologies. In: SPIE (Hrsg.): Microelectronics, MEMS, and Nanotechnology (SPIE International Symposium Perth, Australia Dezember 2003). n.a. : n.a., 2003, S. n.a.
