2020

Publikationen des Jahres 2020

• "Yield prediction in semiconductor manufacturing using an AI-based cascading classification system"
  Stich, P., Wahl, M., Czerner, P., Weber, C., Madjid, F.
  In 20th Annual IEEE International Conference on Electro Information Technology. Illinois August 2020.

• "The TRACE Methodology"
  Buch, R., Wahl, M., Völkel, H., Aal, A.
  VDE VERLAG GMBH, AmE 2020 - Automotive meets Electronics , Dortmund 2020.