Rebecca Busch, Michael Wahl, Bhaskar Coubey, “Wafer yield prediction using AI: Potentials and pitfalls”, SPIE Advanced Lithography + Patterning, USA, San Jose, 2023
Rebecca Busch, Peter Czerner, Michael Wahl und Bhaskar Choubey, “Yield prediction with Machine Learning and parameter limits in semiconductor production”,2022 International Symposium on Semiconductor Manufacturing (ISSM) - Tokyo, Japan, 2022
Rebecca Busch, Michael Wahl, Holger Völkel, Andreas Aal, "The TRACE Methodology", VDE VERLAG GMBH, Berlin, Offenbach, Automotive meets Electronics, 10. – 11.03.2020, Dortmund
Rebecca Busch, Dominik Thinay, Michael Wahl, "Cost data modeling in relation to the TRACE project", VDE VERLAG GMBH, Berlin, Offenbach, Automotive meets Electronics, 12. – 13.03.2019, Dortmund
Rebecca Busch, Kai Hahn, Martin Nüsse, Michael Wahl, "Data Concepts for Manufacturing and Cost Management of Automotive IC Technologies", VDE VERLAG GMBH, Berlin, Offenbach, Automotive meets Electronics, 07. – 08.03.2018, Dortmund.
